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References (16)
-
S. Newcomb, W. Stobbs (1984)
A transmission electron microscopy study of the white-etching layer on a rail headMaterials Science and Engineering, 66
-
L. Marks, David Smith (1983)
Direct surface imaging in small metal particlesNature, 303
-
M. Abrahams, C. Buiocchi (1974)
Cross‐sectional specimens for transmission electron microscopyJournal of Applied Physics, 45
-
J. Bravman, R. Sinclair (1984)
The preparation of cross‐section specimens for transmission electron microscopyJournal of Electron Microscopy Technique, 1
-
H. Akahori (1961)
Electron Microscopic Study of Growing Mechanism of Aluminium Anodic Oxide FilmJournal of Electron Microscopy, 10
-
(1980)
Methods of preparing -
W. Stobbs, J. Kallend, John Williams (1976)
Deformation behaviour of copper in ultramicrotomyActa Metallurgica, 24
-
D. Barber (1970)
Thin foils of non-metals made for electron microscopy by sputter-etchingJournal of Materials Science, 5
-
C. Baxter, W. Stobbs (1985)
TEM methods for the characterization of fine metal multilayersUltramicroscopy, 16
-
(1984)
A microstructural study of melt -
(1984)
Traverse sections of anodised aluminium -
M. Manning, P. Rowlands (1980)
Method of Preparing TEM Foils from thick Oxides and Metal/Oxide InterfacesBritish Corrosion Journal, 15
-
R. Mccune, H. Plummer (1982)
Transmission electron microscopy of ultramicrotomed barrier anodic films on aluminiumSurface and Interface Analysis, 4
-
S. Newcomb, W. Stobbs (1983)
The transmission electron microscopy of oxide scale formation on Fe‐Ni‐Cr alloysJournal of Microscopy, 130
-
W. Stobbs (1984)
Problem oriented transmission electron microscopyJournal of Microscopy, 136
-
T. Sheng, R. Marcus (1980)
Advances in Transmission Electron Microscope Techniques Applied to Device Failure AnalysisJournal of The Electrochemical Society, 127
- Publisher
- Wiley
- Copyright
- Copyright © 1985 Wiley Subscription Services, Inc., A Wiley Company
- ISSN
- 0022-2720
- eISSN
- 1365-2818
- DOI
- 10.1111/j.1365-2818.1985.tb02675.x
- Publisher site
- See Article on Publisher Site
Abstract
Various techniques for the preparation of cross‐sectional and plan view TEM specimens of surfaces and interfaces are described. Particular emphasis is given to preparative methods which are both generally applicable and which minimize differential thinning of the materials present on either side of the interface of interest, thereby improving the reliability of the approach.
Journal
Journal of Microscopy – Wiley
Published: Nov 1, 1985
Keywords: ; ; ;