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Cross‐sectional specimens for transmission electron microscopy

Abrahams, M. S.; Buiocchi, C. J.

Journal of Applied Physics , Volume 45 (8): 3315-3316 – Aug 1, 1974

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Cross‐sectional specimens for transmission electron microscopy

Abrahams, M. S.; Buiocchi, C. J.

Journal of Applied Physics , Volume 45 (8): 3315-3316 – Aug 1, 1974

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Publisher: CrossRef
ISSN: 0021-8979
DOI: 10.1063/1.1663778
Publisher site: See Article on Publisher Site

There are no references for this article.