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Scanning Transmission Electron MicroscopyAtomic-Resolution STEM at Low Primary Energies

Scanning Transmission Electron Microscopy: Atomic-Resolution STEM at Low Primary Energies [Aberration-corrected scanning transmission electron microscopes (STEMs) can now produce electron probes as small as 1 Å at 60 keV. This level of performance allows individual light atoms to be imaged in various novel materials including graphene, monolayer boron nitride, and carbon nanotubes. Operation at 60 keV avoids direct knock-on damage in such materials, but some radiation damage often remains, and limits the maximum usable electron dose. Elemental identification by electron energy loss spectroscopy (EELS) is then usefully supplemented by annular dark-field (ADF) imaging, for which the signal is much larger and the spatial resolution significantly better. Because of its strong dependence on the atomic number Z, ADF can be used to identify the chemical type of individual atoms, both heavy and light. We review the instrumental requirements for atomic resolution imaging at 60 keV and lower energies, and we illustrate the kinds of studies that have now become possible by ADF images of graphene, monolayer BN, and single-wall carbon nanotubes, and by ADF images and EEL spectra of carbon nanotubes containing nanopods filled with single atoms of Er. We then discuss likely future developments.] http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png

Scanning Transmission Electron MicroscopyAtomic-Resolution STEM at Low Primary Energies

Editors: Pennycook, Stephen J.; Nellist, Peter D.
Krivanek, Ondrej L.; Chisholm, Matthew F.; Dellby, Niklas; Murfitt, Matthew F.
Scanning Transmission Electron Microscopy — Dec 16, 2010
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References (90)

Publisher
Springer New York
Copyright
© Springer Science+Business Media, LLC 2011
ISBN
978-1-4419-7199-9
Pages
615–658
DOI
10.1007/978-1-4419-7200-2_15
Publisher site
See Chapter on Publisher Site

Abstract

[Aberration-corrected scanning transmission electron microscopes (STEMs) can now produce electron probes as small as 1 Å at 60 keV. This level of performance allows individual light atoms to be imaged in various novel materials including graphene, monolayer boron nitride, and carbon nanotubes. Operation at 60 keV avoids direct knock-on damage in such materials, but some radiation damage often remains, and limits the maximum usable electron dose. Elemental identification by electron energy loss spectroscopy (EELS) is then usefully supplemented by annular dark-field (ADF) imaging, for which the signal is much larger and the spatial resolution significantly better. Because of its strong dependence on the atomic number Z, ADF can be used to identify the chemical type of individual atoms, both heavy and light. We review the instrumental requirements for atomic resolution imaging at 60 keV and lower energies, and we illustrate the kinds of studies that have now become possible by ADF images of graphene, monolayer BN, and single-wall carbon nanotubes, and by ADF images and EEL spectra of carbon nanotubes containing nanopods filled with single atoms of Er. We then discuss likely future developments.]

Published: Dec 16, 2010

Keywords: Primary Energy; Scanning Transmission Electron Microscope; Electron Energy Loss Spectroscopy; Spherical Aberration; Probe Size

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