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Recycled Counterfeit Chips Detection for AMS and Digital ICs Using Low-Area, Self-Contained, and Secure LDO Odometers

Recycled Counterfeit Chips Detection for AMS and Digital ICs Using Low-Area, Self-Contained, and... Counterfeit electronics have widespread impacts on the many aspects of modern civilization that depend on integrated circuits (ICs) or chips. Among all of the counterfeit chips types, recycled and remarked are the most prevalent. These are the chips that are taken from discarded, obsolete electronics board and then sold as new. As a result, they are aged and deteriorated with short remaining lifespan and prone to failure. Silicon odometers have been proposed to detect recycled digital ICs, but few are applicable to analog and mixed signal (AMS) chips. Recently, an odometer that can be integrated into a common AMS IP block, the low dropout regulator (LDO), was proposed. However, it has high area overhead, requires external measurements for classification, and has a security vulnerability. In this article, self-contained LDO odometers are proposed that overcome these issues while still being able to detect aging in AMS and digital chips. A calibration feature is also introduced to compensate for process variation. The area overhead of the analog and digital versions are 8μm2\documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$8 \mu m^2$$\end{document} and 3.3μm2\documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$3.3 \mu m^2$$\end{document}, respectively, which are an order of magnitude smaller than the prior state-of-the-art. A detection accuracy of 98.2%\documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$98.2 \%$$\end{document} and 99.5%\documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$99.5 \%$$\end{document} have been achieved for each which are comparable to existing odometers. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of Hardware and Systems Security Springer Journals

Recycled Counterfeit Chips Detection for AMS and Digital ICs Using Low-Area, Self-Contained, and Secure LDO Odometers

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References (38)

Publisher
Springer Journals
Copyright
Copyright © The Author(s), under exclusive licence to Springer Nature Switzerland AG 2024. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.
ISSN
2509-3428
eISSN
2509-3436
DOI
10.1007/s41635-024-00152-8
Publisher site
See Article on Publisher Site

Abstract

Counterfeit electronics have widespread impacts on the many aspects of modern civilization that depend on integrated circuits (ICs) or chips. Among all of the counterfeit chips types, recycled and remarked are the most prevalent. These are the chips that are taken from discarded, obsolete electronics board and then sold as new. As a result, they are aged and deteriorated with short remaining lifespan and prone to failure. Silicon odometers have been proposed to detect recycled digital ICs, but few are applicable to analog and mixed signal (AMS) chips. Recently, an odometer that can be integrated into a common AMS IP block, the low dropout regulator (LDO), was proposed. However, it has high area overhead, requires external measurements for classification, and has a security vulnerability. In this article, self-contained LDO odometers are proposed that overcome these issues while still being able to detect aging in AMS and digital chips. A calibration feature is also introduced to compensate for process variation. The area overhead of the analog and digital versions are 8μm2\documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$8 \mu m^2$$\end{document} and 3.3μm2\documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$3.3 \mu m^2$$\end{document}, respectively, which are an order of magnitude smaller than the prior state-of-the-art. A detection accuracy of 98.2%\documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$98.2 \%$$\end{document} and 99.5%\documentclass[12pt]{minimal}\usepackage{amsmath}\usepackage{wasysym}\usepackage{amsfonts}\usepackage{amssymb}\usepackage{amsbsy}\usepackage{mathrsfs}\usepackage{upgreek}\setlength{\oddsidemargin}{-69pt}\begin{document}$$99.5 \%$$\end{document} have been achieved for each which are comparable to existing odometers.

Journal

Journal of Hardware and Systems SecuritySpringer Journals

Published: Sep 1, 2024

Keywords: Recycled chips; Counterfeit electronics; Silicon odometers; Analog LDO; Digital LDO; On-chip sensors

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