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Finite Sample Lag Adjusted Critical Values and Probability Values for the Fourier Wavelet Unit Root Test

Finite Sample Lag Adjusted Critical Values and Probability Values for the Fourier Wavelet Unit... Inferences from tests for non-stationarity depend critically on whether and how breaks and/or non-linearities are specified. Recent work has shown that wavelet transformations that separate a variable’s high and low frequency components can enhance the performance of unit root and stationarity tests. This note provides response surface estimates of finite sample, lag-adjusted critical values and approximate probability values for an Augmented Dickey–Fuller type wavelet test that includes a Fourier term allowing for smooth breaks in the series. Applications highlight the practical benefits. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Computational Economics Springer Journals

Finite Sample Lag Adjusted Critical Values and Probability Values for the Fourier Wavelet Unit Root Test

Computational Economics , Volume 64 (2) – Aug 1, 2024

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References (28)

Publisher
Springer Journals
Copyright
Copyright © The Author(s), under exclusive licence to Springer Science+Business Media, LLC, part of Springer Nature 2023. Springer Nature or its licensor (e.g. a society or other partner) holds exclusive rights to this article under a publishing agreement with the author(s) or other rightsholder(s); author self-archiving of the accepted manuscript version of this article is solely governed by the terms of such publishing agreement and applicable law.
ISSN
0927-7099
eISSN
1572-9974
DOI
10.1007/s10614-023-10458-4
Publisher site
See Article on Publisher Site

Abstract

Inferences from tests for non-stationarity depend critically on whether and how breaks and/or non-linearities are specified. Recent work has shown that wavelet transformations that separate a variable’s high and low frequency components can enhance the performance of unit root and stationarity tests. This note provides response surface estimates of finite sample, lag-adjusted critical values and approximate probability values for an Augmented Dickey–Fuller type wavelet test that includes a Fourier term allowing for smooth breaks in the series. Applications highlight the practical benefits.

Journal

Computational EconomicsSpringer Journals

Published: Aug 1, 2024

Keywords: Integrated processes; Akaike information criterion; Bayesian information criterion; Wavelet; Unit root test; C12; C15; C22

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