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Atom counting in HAADF STEM using a statistical model-based approach: Methodology, possibilities, and inherent limitations

Atom counting in HAADF STEM using a statistical model-based approach: Methodology, possibilities,... http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Ultramicroscopy Unpaywall

Atom counting in HAADF STEM using a statistical model-based approach: Methodology, possibilities, and inherent limitations

Backer, A. De; Martinez, G.T.; Rosenauer, A.; Van Aert, S.
Ultramicroscopy – May 17, 2013
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Publisher
Unpaywall
ISSN
0304-3991
DOI
10.1016/j.ultramic.2013.05.003
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Abstract

Journal

Ultramicroscopy – Unpaywall

Published: May 17, 2013

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