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Quantitative comparisons of contrast in experimental and simulated bright-field<?xpp qa?> scanning transmission electron microscopy images

Quantitative comparisons of contrast in experimental and simulated bright-field... Quantitative, atomic resolution bright-field scanning transmission electron microscopy experiments are reported. The image intensities are placed on an absolute scale relative to the incident beam intensity. Features in the experimental images, such as contrast reversals, intensities, and the image contrast, are compared with image simulations that account for elastic scattering and the effect of phonon scattering. Simulations are carried out using both the multislice absorptive and frozen phonon simulation methods. For a SrTiO 3 sample with thicknesses between 4 and 25 nm, both models agree within the experimental uncertainty. We demonstrate excellent agreement between the simulated and the experimentally observed image contrast. The implications for the contrast mismatch commonly reported for high-resolution transmission electron microscopy using plane-wave illumination are discussed. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Physical Review B American Physical Society (APS)

Quantitative comparisons of contrast in experimental and simulated bright-field<?xpp qa?> scanning transmission electron microscopy images

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References (6)

Publisher
American Physical Society (APS)
Copyright
Copyright © 2009 The American Physical Society
ISSN
1550-235X
DOI
10.1103/PhysRevB.80.174106
Publisher site
See Article on Publisher Site

Abstract

Quantitative, atomic resolution bright-field scanning transmission electron microscopy experiments are reported. The image intensities are placed on an absolute scale relative to the incident beam intensity. Features in the experimental images, such as contrast reversals, intensities, and the image contrast, are compared with image simulations that account for elastic scattering and the effect of phonon scattering. Simulations are carried out using both the multislice absorptive and frozen phonon simulation methods. For a SrTiO 3 sample with thicknesses between 4 and 25 nm, both models agree within the experimental uncertainty. We demonstrate excellent agreement between the simulated and the experimentally observed image contrast. The implications for the contrast mismatch commonly reported for high-resolution transmission electron microscopy using plane-wave illumination are discussed.

Journal

Physical Review B – American Physical Society (APS)

Published: Nov 1, 2009

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