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Applied Logistic Regression

Hosmer, David W.; Lemeshow, Stanley; Sturdivant, Rodney X.

Wiley Series in Probability and Statistics – Mar 22, 2013

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Applied Logistic Regression

Hosmer, David W.; Lemeshow, Stanley; Sturdivant, Rodney X.

Wiley Series in Probability and Statistics – Mar 22, 2013

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Publisher: CrossRef
ISSN: 1940-6347
DOI: 10.1002/9781118548387
Publisher site: See Article on Publisher Site

There are no references for this article.