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Rapid measurement of nanoparticle thickness profiles.

Rapid measurement of nanoparticle thickness profiles. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Ultramicroscopy Pubmed

Rapid measurement of nanoparticle thickness profiles.

Katz-Boon, Hadas; Rossouw, Chris J; Dwyer, Christian; Etheridge, Joanne
Ultramicroscopy , Volume 124: 10 – Aug 15, 2013
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ISSN
0304-3991
DOI
10.1016/j.ultramic.2012.08.009
pmid
23142746

Abstract

Journal

Ultramicroscopy – Pubmed

Published: Aug 15, 2013

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