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Differential phase-contrast microscopy at atomic resolution

Differential phase-contrast microscopy at atomic resolution A technique capable of detecting the electric field associated with individual atoms is now demonstrated. Atomic-resolution differential phase-contrast imaging using aberration-corrected scanning transmission electron microscopy provides a sensitive probe of the gradient of the electrostatic potential in a crystal lattice. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Nature Physics Springer Journals

Differential phase-contrast microscopy at atomic resolution

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References (22)

Publisher
Springer Journals
Copyright
Copyright © Springer Nature Limited 2012
Subject
Physics; Physics, general; Theoretical, Mathematical and Computational Physics; Classical and Continuum Physics; Atomic, Molecular, Optical and Plasma Physics; Condensed Matter Physics; Complex Systems
ISSN
1745-2473
eISSN
1745-2481
DOI
10.1038/nphys2337
Publisher site
See Article on Publisher Site

Abstract

A technique capable of detecting the electric field associated with individual atoms is now demonstrated. Atomic-resolution differential phase-contrast imaging using aberration-corrected scanning transmission electron microscopy provides a sensitive probe of the gradient of the electrostatic potential in a crystal lattice.

Journal

Nature PhysicsSpringer Journals

Published: Aug 1, 2012

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