Access the full text.
Sign up today, get DeepDyve free for 14 days.
Loading next page...
/lp/wiley/application-of-tougaard-background-subtraction-to-xps-spectra-of-GwzZuOyOdr
References (13)
-
H. Knote, S. Hofmann, H. Fischmeister (1987)
AES- und XPS-Untersuchungen zum Einfluß von Chrom, Nickel und Molybdän auf das Korrosionsverhalten von rostfreien Stählen in SäurenFresenius' Zeitschrift für analytische Chemie, 329
-
C. Leygraf, G. Hultquist, I. Olefjord, B. Elfström, V. Knyazheva, A. Plaskeyev, Y. Kolotyrkin (1979)
Selective dissolution and surface enrichment of alloy components of passivated Fe18Cr and Fe18Cr3Mo single crystalsCorrosion Science, 19
-
S. Mischler, H. Mathieu, D. Landolt (1988)
Investigation of a passive film on an ironchromium alloy by AES and XPSSurface and Interface Analysis, 11
-
K. Asami, K. Hashimoto, S. Shimodaira (1978)
An XPS study of the passivity of a series of iron—chromium alloys in sulphuric acid*†Corrosion Science, 18
-
S. Tougaard, H. Hansen (1989)
Non‐destructive depth profiling through quantitative analysis of surface electron spectraSurface and Interface Analysis, 14
-
S. Tougaard (1990)
Inelastic background correction and quantitative surface analysisJournal of Electron Spectroscopy and Related Phenomena, 52
-
S. Tanuma, C. Powell, D. Penn (1991)
Calculations of electorn inelastic mean free paths. II. Data for 27 elements over the 50–2000 eV rangeSurface and Interface Analysis, 17
-
P. Marcus, I. Olefjord (1988)
Round Robin on combined electrochemical and AES/ESCA characterization of the passive films on FeCr and FeCrMo alloysSurface and Interface Analysis, 11
-
J. Häfele, B. Heine, R. Kirchheim (1992)
On the Kinetics of Passive Film Formation of Iron and Iron - Chromium AlloysInternational Journal of Materials Research, 83
-
H. Hansen, S. Tougaard (1991)
SEPARATION OF SPECTRAL COMPONENTS AND DEPTH PROFILING THROUGH INELASTIC BACKGROUND ANALYSIS OF XPS SPECTRA WITH OVERLAPPING PEAKSSurface and Interface Analysis, 17
-
R. Kirchheim, B. Heine, H. Fischmeister, S. Hofmann, H. Knote, U. Stolz (1989)
The passivity of iron-chromium alloysCorrosion Science, 29
-
H. Ebel, M. Ebel, R. Svagera, E. Winklmayr, P. Varga (1991)
A comparison of two XPS methods for quantification of concentration profilesJournal of Electron Spectroscopy and Related Phenomena, 57
-
S. Haupt, H. Strehblow (1989)
Combined electrochemical and surface analytical investigations of the formation of passive layersCorrosion Science, 29
- Publisher
- Wiley
- Copyright
- Copyright © 1994 John Wiley & Sons Ltd.
- ISSN
- 0142-2421
- eISSN
- 1096-9918
- DOI
- 10.1002/sia.740210609
- Publisher site
- See Article on Publisher Site
Abstract
In order to examine the spectra of films formed during the polarization of an Fe–17 Cr alloy in 0.5 M sulphuric acid, it is necessary to separate the overlapping spectral components of the film and substrate. The procedure for peak separation and background subtraction as proposed by Hansen and Tougaard was followed and is described in detail for the present case. On applying the procedure it was observed that the results obtained are sensitive to the value used for the film thickness in calculating the contribution from the substrate to the overall spectrum. Thus, the film thickness can be regarded as an outcome of the procedure. The elastic XPS spectrum of the film remaining after peak separation and background subtraction was compared to that obtained after subtraction of a Shirley background followed by curve fitting of the substrate contribution.
Journal
Surface and Interface Analysis – Wiley
Published: Jun 1, 1994