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Wavefront sensors for control and processing monitoring in optics manufacture

Wavefront sensors for control and processing monitoring in optics manufacture Measurement is an integral part of optics manufacture, where grinding and polishing steps are linked iteratively with the testing steps. While numerous test methods have been developed, many of these are prone to vibration effects that limit their application to in-situ monitoring, or have other limitations. We have applied Shack-Hartmann wavefront sensors to the problems of optics measurement. We have developed an instrument that allows testing in common configurations, and also provides new ways to test optics. The current device is extremely sensitive. We have demonstrated this device for testing various optical elements including lenses, mirrors and laser rods. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Proceedings of SPIE SPIE

Wavefront sensors for control and processing monitoring in optics manufacture

Neal, Daniel R.
Proceedings of SPIE , Volume 2993 (1) – Mar 27, 1997
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Publisher
SPIE
Copyright
Copyright © 2005 COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
ISSN
0277-786X
eISSN
1996-756X
DOI
10.1117/12.270030
Publisher site
See Article on Publisher Site

Abstract

Measurement is an integral part of optics manufacture, where grinding and polishing steps are linked iteratively with the testing steps. While numerous test methods have been developed, many of these are prone to vibration effects that limit their application to in-situ monitoring, or have other limitations. We have applied Shack-Hartmann wavefront sensors to the problems of optics measurement. We have developed an instrument that allows testing in common configurations, and also provides new ways to test optics. The current device is extremely sensitive. We have demonstrated this device for testing various optical elements including lenses, mirrors and laser rods.

Journal

Proceedings of SPIE – SPIE

Published: Mar 27, 1997

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