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Analysis of Threshold Voltage Distribution Due to Random Dopants: A 100 000-Sample 3-D Simulation Study

Analysis of Threshold Voltage Distribution Due to Random Dopants: A 100 000-Sample 3-D Simulation... http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png IEEE Transactions on Electron Devices CrossRef

Analysis of Threshold Voltage Distribution Due to Random Dopants: A 100 000-Sample 3-D Simulation Study

Reid, Dave; Millar, Campbell; Roy, Gareth; Roy, Scott; Asenov, Asen
IEEE Transactions on Electron Devices , Volume 56 (10): 2255-2263 – Oct 1, 2009
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Publisher
CrossRef
ISSN
0018-9383
DOI
10.1109/ted.2009.2027973
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Journal

IEEE Transactions on Electron Devices – CrossRef

Published: Oct 1, 2009

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