Get 20M+ Full-Text Papers For Less Than $1.50/day. Start a 7-Day Trial for You or Your Team.

Learn More →

DeepDyve requires Javascript to function. Please enable Javascript on your browser to continue.

Investigation of Negative Capacitance in Admittance Analysis of Metal Semiconductors Interlayered With ZnFe<sub>2</sub>O<sub>4</sub> Doped PVA

Alsmael, Jaafar Abdulkareem Mustafa; Tan, Serhat Orkun

IEEE Transactions on Nanotechnology , Volume 23: 102-108 – Jan 1, 2024

Download PDF

Investigation of Negative Capacitance in Admittance Analysis of Metal Semiconductors Interlayered With ZnFe<sub>2</sub>O<sub>4</sub> Doped PVA

Alsmael, Jaafar Abdulkareem Mustafa; Tan, Serhat Orkun

IEEE Transactions on Nanotechnology , Volume 23: 102-108 – Jan 1, 2024

Loading next page...

References (0)

References for this paper are not available at this time. We will be adding them shortly, thank you for your patience.

Publisher: CrossRef
ISSN: 1536-125X
DOI: 10.1109/tnano.2024.3353379
Publisher site: See Article on Publisher Site

There are no references for this article.