In automotive industry, reliability analysis of smart power semiconductor devices is mandatory for safety reasons. To reliably forecast the lifetime of devices, a mathematical description of the material degradation due to applied stress is required. In this work, the degradation process of a metal film of interest under thermo‐mechanical stress is studied. Therefore, a bi‐layer test structure (metal film on substrate) is used. Degradation refers to the formation, growth and coalescence of voids, initializing cracks that propagate through the metal film. Since the film's elastic‐plastic deformation is triggered by random diffusional activities with drift, stochastic differential equations (SDEs) are used to model the evolution of the microstructural heterogeneity in the metallization.
Proceedings in Applied Mathematics & Mechanics – Wiley
Published: Jan 1, 2017
It’s your single place to instantly
discover and read the research
that matters to you.
Enjoy affordable access to
over 18 million articles from more than
15,000 peer-reviewed journals.
All for just $49/month
Query the DeepDyve database, plus search all of PubMed and Google Scholar seamlessly
Save any article or search result from DeepDyve, PubMed, and Google Scholar... all in one place.
Get unlimited, online access to over 18 million full-text articles from more than 15,000 scientific journals.
Read from thousands of the leading scholarly journals from SpringerNature, Elsevier, Wiley-Blackwell, Oxford University Press and more.
All the latest content is available, no embargo periods.
“Hi guys, I cannot tell you how much I love this resource. Incredible. I really believe you've hit the nail on the head with this site in regards to solving the research-purchase issue.”Daniel C.
“Whoa! It’s like Spotify but for academic articles.”@Phil_Robichaud
“I must say, @deepdyve is a fabulous solution to the independent researcher's problem of #access to #information.”@deepthiw
“My last article couldn't be possible without the platform @deepdyve that makes journal papers cheaper.”@JoseServera