Parameter Identification in Stochastic Differential Equations to Model the Degradation of Metal Films

Parameter Identification in Stochastic Differential Equations to Model the Degradation of Metal... In automotive industry, reliability analysis of smart power semiconductor devices is mandatory for safety reasons. To reliably forecast the lifetime of devices, a mathematical description of the material degradation due to applied stress is required. In this work, the degradation process of a metal film of interest under thermo‐mechanical stress is studied. Therefore, a bi‐layer test structure (metal film on substrate) is used. Degradation refers to the formation, growth and coalescence of voids, initializing cracks that propagate through the metal film. Since the film's elastic‐plastic deformation is triggered by random diffusional activities with drift, stochastic differential equations (SDEs) are used to model the evolution of the microstructural heterogeneity in the metallization. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Proceedings in Applied Mathematics & Mechanics Wiley

Parameter Identification in Stochastic Differential Equations to Model the Degradation of Metal Films

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Publisher
Wiley Subscription Services, Inc., A Wiley Company
Copyright
Copyright © 2017 Wiley Subscription Services
ISSN
1617-7061
eISSN
1617-7061
D.O.I.
10.1002/pamm.201710355
Publisher site
See Article on Publisher Site

Abstract

In automotive industry, reliability analysis of smart power semiconductor devices is mandatory for safety reasons. To reliably forecast the lifetime of devices, a mathematical description of the material degradation due to applied stress is required. In this work, the degradation process of a metal film of interest under thermo‐mechanical stress is studied. Therefore, a bi‐layer test structure (metal film on substrate) is used. Degradation refers to the formation, growth and coalescence of voids, initializing cracks that propagate through the metal film. Since the film's elastic‐plastic deformation is triggered by random diffusional activities with drift, stochastic differential equations (SDEs) are used to model the evolution of the microstructural heterogeneity in the metallization.

Journal

Proceedings in Applied Mathematics & MechanicsWiley

Published: Jan 1, 2017

References

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