Microstructural investigations of SrTiO 3 single crystals and polysilicon using a powerful new X‐ray diffraction surface mapping technique

Microstructural investigations of SrTiO 3 single crystals and polysilicon using a powerful new... In the research work described here, single‐crystalline SrTiO3 has been used as a model system to facilitate the development of a new qualitative characterization method for the nondestructive identification of small‐angle boundaries in bulk single crystals. Subgrain misorientations with a lower limit in the range between 40 and 100′′ were reliably identified. For scientists and engineers working in the field of single‐crystal growth it is often indispensable to continuously check the structural quality of the grown bulk crystals, which is usually time consuming or challenging for large single crystals. This article presents in detail how a spatially resolved micro X‐ray fluorescent device can be used for the identification of subgrains and merely a one‐side‐planarized sample of nearly arbitrary geometry is needed. The approach presented combines high‐speed measurements and full sample area coverage with a high spatial resolution of 25 µm. The resolution is limited by the spot size of the focused X‐ray beam. The Bremsstrahlung of the excitation source interacts with the crystals, and because of the instrument geometry it is possible to detect Bragg reflections. These reflections can be found at specific energies and can be displayed in two‐dimensional diffraction intensity maps. These maps were used for the qualitative analysis of the crystal domains. The results obtained by this new approach were verified by rocking curve measurements and by defect‐selective etching studies. Ultrafast large‐area mappings on widely used polysilicon were additionally performed to demonstrate the potential of the developed method for use in industrial applications. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of Applied Crystallography Wiley

Microstructural investigations of SrTiO 3 single crystals and polysilicon using a powerful new X‐ray diffraction surface mapping technique

Loading next page...
 
/lp/wiley/microstructural-investigations-of-srtio-3-single-crystals-and-6DrsGi0GIj
Publisher
Wiley
Copyright
International Union of Crystallography, 2015
ISSN
1600-5767
eISSN
1600-5767
DOI
10.1107/S1600576715019949
Publisher site
See Article on Publisher Site

Abstract

In the research work described here, single‐crystalline SrTiO3 has been used as a model system to facilitate the development of a new qualitative characterization method for the nondestructive identification of small‐angle boundaries in bulk single crystals. Subgrain misorientations with a lower limit in the range between 40 and 100′′ were reliably identified. For scientists and engineers working in the field of single‐crystal growth it is often indispensable to continuously check the structural quality of the grown bulk crystals, which is usually time consuming or challenging for large single crystals. This article presents in detail how a spatially resolved micro X‐ray fluorescent device can be used for the identification of subgrains and merely a one‐side‐planarized sample of nearly arbitrary geometry is needed. The approach presented combines high‐speed measurements and full sample area coverage with a high spatial resolution of 25 µm. The resolution is limited by the spot size of the focused X‐ray beam. The Bremsstrahlung of the excitation source interacts with the crystals, and because of the instrument geometry it is possible to detect Bragg reflections. These reflections can be found at specific energies and can be displayed in two‐dimensional diffraction intensity maps. These maps were used for the qualitative analysis of the crystal domains. The results obtained by this new approach were verified by rocking curve measurements and by defect‐selective etching studies. Ultrafast large‐area mappings on widely used polysilicon were additionally performed to demonstrate the potential of the developed method for use in industrial applications.

Journal

Journal of Applied CrystallographyWiley

Published: Dec 1, 2015

There are no references for this article.

You’re reading a free preview. Subscribe to read the entire article.


DeepDyve is your
personal research library

It’s your single place to instantly
discover and read the research
that matters to you.

Enjoy affordable access to
over 18 million articles from more than
15,000 peer-reviewed journals.

All for just $49/month

Explore the DeepDyve Library

Search

Query the DeepDyve database, plus search all of PubMed and Google Scholar seamlessly

Organize

Save any article or search result from DeepDyve, PubMed, and Google Scholar... all in one place.

Access

Get unlimited, online access to over 18 million full-text articles from more than 15,000 scientific journals.

Your journals are on DeepDyve

Read from thousands of the leading scholarly journals from SpringerNature, Elsevier, Wiley-Blackwell, Oxford University Press and more.

All the latest content is available, no embargo periods.

See the journals in your area

DeepDyve

Freelancer

DeepDyve

Pro

Price

FREE

$49/month
$360/year

Save searches from
Google Scholar,
PubMed

Create folders to
organize your research

Export folders, citations

Read DeepDyve articles

Abstract access only

Unlimited access to over
18 million full-text articles

Print

20 pages / month

PDF Discount

20% off