IntroductionThe Tauc method of determining the optical absorption edge of materials is a well‐known technique used to characterize functional photovoltaic layers, transparent conductors, sensor coatings, and films for many other applications. This method was originally designed for determinations of absorption in amorphous thin‐film materials. Since then, the Tauc method has been widely used on crystalline thin films as well. Because UV‐Vis spectrometers are widely available, easy to use, and the absorbance equation is well understood, the Tauc method is often used instead of more accurate means (e.g., spectroscopic ellipsometry or photothermal spectroscopy). In the Tauc method, broad spectral absorption spectroscopy results are fitted using a power‐law expression. The photon‐energy axis intercept of this fit then reveals the band gap of the material in question, and the fitted exponent indicates either a direct or indirect electron transition. In earlier work, we had addressed the accuracy of band gap determination using Tauc's method. However, that work stopped short of testing how well the Tauc slope parameter might work to provide a deeper view of a new material's band structure. In this paper, we quantitatively examine those slope values and their variations aiming to evaluate the Tauc method's utility for further band
Physica Status Solidi (B) Basic Solid State Physics – Wiley
Published: Jan 1, 2018
Keywords: ; ; ; ; ;
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