Changes in the structure and electrical properties of Cd1–x Zn x Te real crystals due to x-irradiation with powers commonly used in x-ray crystallography are studied experimentally. The structure is examined by high-resolution x-ray diffraction, and the electrical properties are measured by the method of thermally induced capacitor discharge. It is established that irreversible changes occur in both the structure and the deep-level configuration of the crystals if the x-ray power is above 1 kW. The mechanism of the transformation and a possible way to modify electrical properties by x-irradiation are discussed.
Russian Microelectronics – Springer Journals
Published: Oct 13, 2004
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