X-Ray Diffractometric Study and Electrophysical Properties of Phases in the CaTa2O6 – NdTa3O9 SYSTEM

X-Ray Diffractometric Study and Electrophysical Properties of Phases in the CaTa2O6 – NdTa3O9... The method of x-ray diffraction analysis is used for studying phase formation in the CaTa2O6 – NdTa3O9 system at up to 1400°C. It is shown that there exists a region of solid solutions of a rhombic crystal system based on NdTa3O9, the boundary of homogeneity of which lies at up to 40 mol.% CaTa2O6. Specimens of the studied solid solutions possess an elevated dielectric constant (e ∼ 50 at room temperature). The temperature dependences of the electrical conductivity and the dielectric constants of the solid solutions in the range 20 – 450°C show that the polarization has a relaxation nature. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Refractories and Industrial Ceramics Springer Journals

X-Ray Diffractometric Study and Electrophysical Properties of Phases in the CaTa2O6 – NdTa3O9 SYSTEM

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Publisher
Kluwer Academic Publishers-Plenum Publishers
Copyright
Copyright © 2000 by Plenum Publishing Corporation
Subject
Materials Science; Characterization and Evaluation of Materials; Materials Science, general; Ceramics, Glass, Composites, Natural Materials
ISSN
1083-4877
eISSN
1573-9139
D.O.I.
10.1023/A:1011360418213
Publisher site
See Article on Publisher Site

Abstract

The method of x-ray diffraction analysis is used for studying phase formation in the CaTa2O6 – NdTa3O9 system at up to 1400°C. It is shown that there exists a region of solid solutions of a rhombic crystal system based on NdTa3O9, the boundary of homogeneity of which lies at up to 40 mol.% CaTa2O6. Specimens of the studied solid solutions possess an elevated dielectric constant (e ∼ 50 at room temperature). The temperature dependences of the electrical conductivity and the dielectric constants of the solid solutions in the range 20 – 450°C show that the polarization has a relaxation nature.

Journal

Refractories and Industrial CeramicsSpringer Journals

Published: Oct 7, 2004

References

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