Virtual scanning: A method for testing one class of self-organizing cellular automata

Virtual scanning: A method for testing one class of self-organizing cellular automata The problem of formation of diagnosis about a cellular automaton (an array of processor elements) with a large number of processors and multiple failures is solved on a self-organization basis. We suggest a virtual scan method in which the flip-flop link configuration is determined from the actual layout of good cells and intercellular links. Starting from the initial cell at the periphery of the array, the scan chain is constructed as the result of the group behavior of identically functioning cells. Along this chain, diagnosis about all cells and cell interfaces that have a good route to the initial cell is formed. This method is an alternative to the conventional scan method based on an end-to-end shift register, where deterministic control and fixed flip-flop links in the shift chains are used. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Virtual scanning: A method for testing one class of self-organizing cellular automata

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Publisher
Nauka/Interperiodica
Copyright
Copyright © 2000 by MAIK “Nauka/Interperiodica”
Subject
Engineering; Electronic and Computer Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1007/BF02773247
Publisher site
See Article on Publisher Site

Abstract

The problem of formation of diagnosis about a cellular automaton (an array of processor elements) with a large number of processors and multiple failures is solved on a self-organization basis. We suggest a virtual scan method in which the flip-flop link configuration is determined from the actual layout of good cells and intercellular links. Starting from the initial cell at the periphery of the array, the scan chain is constructed as the result of the group behavior of identically functioning cells. Along this chain, diagnosis about all cells and cell interfaces that have a good route to the initial cell is formed. This method is an alternative to the conventional scan method based on an end-to-end shift register, where deterministic control and fixed flip-flop links in the shift chains are used.

Journal

Russian MicroelectronicsSpringer Journals

Published: Dec 4, 2007

References

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