Use of Wavelets to Compare Simulated Yield Patterns for Precision Agriculture at the Field Scale

Use of Wavelets to Compare Simulated Yield Patterns for Precision Agriculture at the Field Scale In this paper spatial patterns of simulated water limited potato production for a farm field in the Netherlands are analyzed using wavelets. The simulated yield patterns are decomposed using wavelets into crystals with a varying resolution. These crystals are used to relate the simulated spatial patterns to weather conditions. We compare simulated yield patterns from 10 successive years to arrive at a prototype patterns that can be used as a basis for site-specific management. Typical patterns for dry and wet years are quantified using wavelets. Wavelets provide a mechanism to distinguish between spatial patterns and allow a quantitative approach for classification of these spatial patterns. Precision Agriculture Springer Journals

Use of Wavelets to Compare Simulated Yield Patterns for Precision Agriculture at the Field Scale

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Kluwer Academic Publishers
Copyright © 2000 by Kluwer Academic Publishers
Life Sciences; Agriculture; Soil Science & Conservation; Remote Sensing/Photogrammetry; Statistics for Engineering, Physics, Computer Science, Chemistry and Earth Sciences; Atmospheric Sciences
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