Access the full text.
Sign up today, get DeepDyve free for 14 days.
S. Hua, H. Chopra (2003)
100,000% Ballistic magnetoresistance in stable Ni nanocontacts at room temperatureScopus
A.A. Bukharaev, N.V. Berdunov, D.V. Ovchinnikov, K.M. Salikhov (1997)
Atomic Force Microscopy for Metrology of Micro-and NanostructuresMikroelektronika, 26
V. Bykov, A. Gologanov, V. Shevyakov (1998)
Test structure for SPM tip shape deconvolutionApplied Physics A, 66
A. Bukharaev, N. Berdunov, D. Ovchinnikov, K. Salikhov (1998)
THREE-DIMENSIONAL PROBE AND SURFACE RECONSTRUCTION FOR ATOMIC FORCE MICROSCOPY USING A DECONVOLUTION ALGORITHM
S. Chung, M. Muñoz, N. García, W. Egelhoff, R. Gomez (2003)
Universal scaling of magnetoconductance in magnetic nanocontacts (invited)Journal of Applied Physics, 93
E. Betzig, P. Finn, J. Weiner (1992)
Combined shear force and near‐field scanning optical microscopyApplied Physics Letters, 60
D. Pohl, W. Denk, M. Lanz (1984)
Optical stethoscopy: Image recording with resolution λ/20Applied Physics Letters, 44
P. Markiewicz, R. Sidney, S.R. Cohen, A. Efimov, D.V. Ovchinnikov, A.A. Bukharaev (1999)
SPM Tip Visualization through Deconvolution Using Various Characterizers: Optimization of the Protocol for Obtaining True Surface Topography from Experimentally Acquired ImagesProbe Microsc., 1
S.H. Chung, M. Munoz, N. Garcia (2003)
Universal Scaling of Magnetoconductance in Magnetic NanocontactsJ. Appl. Phys., 93
H. Lemke, T. Göddenhenrich, H. Bochem, U. Hartmann, C. Heiden (1990)
Improved microtips for scanning probe microscopyReview of Scientific Instruments, 61
N. García, G. Qiang, I. Saveliev (2002)
Balistic magnetoresistance in nanocontacts electrochemically grown between macro- and microscopic ferromagnetic electrodesApplied Physics Letters, 80
N. García, M. Muñoz, Y. Zhao (1999)
MAGNETORESISTANCE IN EXCESS OF 200% IN BALLISTIC NI NANOCONTACTS AT ROOM TEMPERATURE AND 100 OEPhysical Review Letters, 82
H. Chopra, S. Hua (2002)
Ballistic magnetoresistance over 3000% in Ni nanocontacts at room temperaturePhysical Review B, 66
This study is concerned with the tip-shape reconstruction for the shear-force scanning probe microscope and the near-field scanning optical microscope, in which the probe executes lateral vibrations. The spatial resolution of the microscopes is directly dependent on the tip radius. A reconstruction method is proposed that employs specially designed test structures and is based on deconvolution. The method is used to generate images of tungsten and nickel wire probes, fabricated by electrochemical etching, and near-field optical-fiber probes. The results are verified by TEM imaging of the probes. By the same approach, correlation is revealed between reconstructed probe aperture and resolution for the near-field optical microscope.
Russian Microelectronics – Springer Journals
Published: Sep 27, 2005
Access the full text.
Sign up today, get DeepDyve free for 14 days.