The variant cycle-cover problem in fault detection and localization for mesh all-optical networks

The variant cycle-cover problem in fault detection and localization for mesh all-optical networks With the soaring channel speed and density in all-optical networks (AONs), the risk of high data loss upon network faults increases quickly. To manage network faults efficiently, an m-cycle based fault detection and localization (MFDL) scheme has been introduced recently. This paper verifies the necessary and sufficient condition for achieving the complete fault localization (CFL) in MFDL, which is defined as the case that every single network fault can be located to a unique link. We model the m-cycle construction as a new mathematical problem: the variant version of the constrained cycle-cover problem (vCCCP) and explore its formal expression. The model includes the consideration of the cycle-length limit, cycle number, and wavelength cost, while also keeps the CFL achievable. A two-phase branch-and-bound (B&B) algorithm was developed for solving the vCCCP, which guarantees to find near-optimal solutions. This algorithm is then applied to four typical and four random network examples to validate and assess the performance. The results are analyzed and compared with some previously reported algorithms, in terms of fault localization degree, cycle number, wavelength overhead, and cost reduction. The performance evaluation and comparison reveal that the new model and algorithm could significantly reduce the MFDL cost, including both the cost of monitoring devices and reserved wavelengths. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Photonic Network Communications Springer Journals

The variant cycle-cover problem in fault detection and localization for mesh all-optical networks

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Publisher
Springer US
Copyright
Copyright © 2007 by Springer Science+Business Media, LLC
Subject
Computer Science; Computer Communication Networks; Electrical Engineering; Characterization and Evaluation of Materials
ISSN
1387-974X
eISSN
1572-8188
D.O.I.
10.1007/s11107-007-0058-1
Publisher site
See Article on Publisher Site

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