The synthesis and characterization of Cu2ZnSnS4 thin films from melt reactions using xanthate precursors

The synthesis and characterization of Cu2ZnSnS4 thin films from melt reactions using xanthate... Kesterite, Cu2ZnSnS4 (CZTS), is a promising absorber layer for use in photovoltaic cells. We report the use of copper, zinc and tin xanthates in melt reactions to produce Cu2ZnSnS4 (CZTS) thin films. The phase of the as-produced CZTS is dependent on decomposition temperature. X-ray diffraction patterns and Raman spectra show that films annealed between 375 and 475 °C are tetragonal, while at temperatures <375 °C hexagonal material was obtained. The electrical parameters of the CZTS films have also been determined. The conduction of all films was p-type, while the other parameters differ for the hexagonal and tetragonal materials: resistivity (27.1 vs 1.23 Ω cm), carrier concentration (2.65 × 10+15 vs 4.55 × 10+17 cm−3) and mobility (87.1 vs 11.1 cm2 V−1 s−1). The Hall coefficients were 2.36 × 103 versus 13.7 cm3 C−1. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of Materials Science Springer Journals

The synthesis and characterization of Cu2ZnSnS4 thin films from melt reactions using xanthate precursors

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Publisher
Springer US
Copyright
Copyright © 2017 by The Author(s)
Subject
Materials Science; Materials Science, general; Characterization and Evaluation of Materials; Polymer Sciences; Continuum Mechanics and Mechanics of Materials; Crystallography and Scattering Methods; Classical Mechanics
ISSN
0022-2461
eISSN
1573-4803
D.O.I.
10.1007/s10853-017-1367-0
Publisher site
See Article on Publisher Site

Abstract

Kesterite, Cu2ZnSnS4 (CZTS), is a promising absorber layer for use in photovoltaic cells. We report the use of copper, zinc and tin xanthates in melt reactions to produce Cu2ZnSnS4 (CZTS) thin films. The phase of the as-produced CZTS is dependent on decomposition temperature. X-ray diffraction patterns and Raman spectra show that films annealed between 375 and 475 °C are tetragonal, while at temperatures <375 °C hexagonal material was obtained. The electrical parameters of the CZTS films have also been determined. The conduction of all films was p-type, while the other parameters differ for the hexagonal and tetragonal materials: resistivity (27.1 vs 1.23 Ω cm), carrier concentration (2.65 × 10+15 vs 4.55 × 10+17 cm−3) and mobility (87.1 vs 11.1 cm2 V−1 s−1). The Hall coefficients were 2.36 × 103 versus 13.7 cm3 C−1.

Journal

Journal of Materials ScienceSpringer Journals

Published: Jul 20, 2017

References

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