The Influence of Individual Layer Parameters on the Photoluminescent Properties of InxGa1 – xAs/GaAs System

The Influence of Individual Layer Parameters on the Photoluminescent Properties of InxGa1 –... Structure parameters of individual layers in the In x Ga1 – x As/GaAs system were studied by high-resolution X-ray diffractometry. The parameter uniformity over the layer surface was examined. Obtained results were correlated with photoluminescent data. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

The Influence of Individual Layer Parameters on the Photoluminescent Properties of InxGa1 – xAs/GaAs System

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Publisher
Kluwer Academic Publishers-Plenum Publishers
Copyright
Copyright © 2000 by MAIK “Nauka/Interperiodica”
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1023/A:1026631817387
Publisher site
See Article on Publisher Site

Abstract

Structure parameters of individual layers in the In x Ga1 – x As/GaAs system were studied by high-resolution X-ray diffractometry. The parameter uniformity over the layer surface was examined. Obtained results were correlated with photoluminescent data.

Journal

Russian MicroelectronicsSpringer Journals

Published: Oct 8, 2004

References

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