The growth, structure, and magnetic properties of thin epitaxial films of GdMnO3 multiferroics

The growth, structure, and magnetic properties of thin epitaxial films of GdMnO3 multiferroics Thin epitaxial gadolinium manganite (GdMnO3) films were manufactured on single-crystal substrates of neodymium gallate (001) (NdGaO3) and strontium titanate (001) (SrTiO3) by the high-frequency magnetron sputtering method. The RBS analysis demonstrated that the thickness of the obtained films was ∼100 nm and the chemical composition corresponded to the stated stoichiometry. It was established by the X-ray diffraction analysis of the structure and phase composition of the obtained films that all films were single-phase but, depending on the temperature of the substrate during sputtering they have one or several types of orientations relative to the substrate. The X-ray diffraction analysis and high-resolution electron microscopy data on gadolinium manganite films on neodymium gallate substrates were verified. Features pointing to phase transitions in GdMnO3 that were earlier discovered on bulk single-crystal samples were found in the temperature dependence of the magnetic susceptibility. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

The growth, structure, and magnetic properties of thin epitaxial films of GdMnO3 multiferroics

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Publisher
SP MAIK Nauka/Interperiodica
Copyright
Copyright © 2012 by Pleiades Publishing, Ltd.
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1134/S1063739712080033
Publisher site
See Article on Publisher Site

Abstract

Thin epitaxial gadolinium manganite (GdMnO3) films were manufactured on single-crystal substrates of neodymium gallate (001) (NdGaO3) and strontium titanate (001) (SrTiO3) by the high-frequency magnetron sputtering method. The RBS analysis demonstrated that the thickness of the obtained films was ∼100 nm and the chemical composition corresponded to the stated stoichiometry. It was established by the X-ray diffraction analysis of the structure and phase composition of the obtained films that all films were single-phase but, depending on the temperature of the substrate during sputtering they have one or several types of orientations relative to the substrate. The X-ray diffraction analysis and high-resolution electron microscopy data on gadolinium manganite films on neodymium gallate substrates were verified. Features pointing to phase transitions in GdMnO3 that were earlier discovered on bulk single-crystal samples were found in the temperature dependence of the magnetic susceptibility.

Journal

Russian MicroelectronicsSpringer Journals

Published: Nov 17, 2012

References

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