The Effect of Ballistic Conduction Electrons on the Current–Voltage Characteristics of Thin-Film Bismuth-Based Cross-Shaped Microstructures

The Effect of Ballistic Conduction Electrons on the Current–Voltage Characteristics of... A decrease in the residual pressure to 10–6 Pa during the deposition of bismuth films results in low-temperature “metallic” conductance of the films. Cross-shaped microstructures made of these films exhibit the property of ballistic transport, which is typical of two-dimensional systems. This property shows up as a bend of the current–voltage characteristics (CVCs). The value of bend resistance changes in inverse proportion to the width of interconnects and drops with increasing temperature in the range of 4.2–77 K. The free path of conduction electrons, are responsible for the CVC bend, was estimated at more than 1 μm. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

The Effect of Ballistic Conduction Electrons on the Current–Voltage Characteristics of Thin-Film Bismuth-Based Cross-Shaped Microstructures

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Publisher
Springer Journals
Copyright
Copyright © 2001 by MAIK “Nauka/Interperiodica”
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1023/A:1009461506486
Publisher site
See Article on Publisher Site

Abstract

A decrease in the residual pressure to 10–6 Pa during the deposition of bismuth films results in low-temperature “metallic” conductance of the films. Cross-shaped microstructures made of these films exhibit the property of ballistic transport, which is typical of two-dimensional systems. This property shows up as a bend of the current–voltage characteristics (CVCs). The value of bend resistance changes in inverse proportion to the width of interconnects and drops with increasing temperature in the range of 4.2–77 K. The free path of conduction electrons, are responsible for the CVC bend, was estimated at more than 1 μm.

Journal

Russian MicroelectronicsSpringer Journals

Published: Oct 10, 2004

References

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