Diagnostic testing of programmable logic arrays that directly implement Boolean functions specified in a polynomial form (i.e., as a combination of AND and EXOR arrays) is considered. Mathematical models for possible faults are constructed, test conditions are formulated, and the fault-detection-test generation problem is solved. Test interchangeability is analyzed in order to optimize and minimize the tests.
Russian Microelectronics – Springer Journals
Published: Dec 4, 2007
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