Get 20M+ Full-Text Papers For Less Than $1.50/day. Start a 14-Day Trial for You or Your Team.

Learn More →

Test and Reliability in Approximate Computing

Test and Reliability in Approximate Computing This paper presents an overview of test and reliability approaches for approximate computing architectures. We focus on how specific methods for test and reliability can be used to improve the characteristics of approximate computing in terms of power consumption, area, life expectancy and precision. This paper does not address specification and design of approximate hardware/software/algorithms, but provides an in-depth knowledge on how the reliability and test related techniques can be efficiently used to maximize the benefits of approximate computing. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of Electronic Testing Springer Journals

Test and Reliability in Approximate Computing

Download PDF
13 pages

Loading next page...
 
/lp/springer_journal/test-and-reliability-in-approximate-computing-9o8PUOw9QR
Publisher
Springer Journals
Copyright
Copyright © 2018 by Springer Science+Business Media, LLC, part of Springer Nature
Subject
Engineering; Circuits and Systems; Electrical Engineering; Computer-Aided Engineering (CAD, CAE) and Design
ISSN
0923-8174
eISSN
1573-0727
DOI
10.1007/s10836-018-5734-9
Publisher site
See Article on Publisher Site

Abstract

This paper presents an overview of test and reliability approaches for approximate computing architectures. We focus on how specific methods for test and reliability can be used to improve the characteristics of approximate computing in terms of power consumption, area, life expectancy and precision. This paper does not address specification and design of approximate hardware/software/algorithms, but provides an in-depth knowledge on how the reliability and test related techniques can be efficiently used to maximize the benefits of approximate computing.

Journal

Journal of Electronic Testing – Springer Journals

Published: May 31, 2018

References

  • Convergence of recognition, mining, synthesis workloads and its implications
    Chen, Y-K
  • Efficient overdetection elimination of acceptable faults for yield improvement
    Lee, KJ; Hsieh, TY; Breuer, MA
  • Priority based error correction code (ECC) for the embedded SRAM memories in H.264 system
    Lee, I; Kwon, J; Park, J; Park, J
  • A HW-SW multicore architecture to tradeoff program accuracy and resilience overheads
    Shi, Q; Hoffmann, H; Khan, O