Test and Reliability in Approximate Computing

Test and Reliability in Approximate Computing This paper presents an overview of test and reliability approaches for approximate computing architectures. We focus on how specific methods for test and reliability can be used to improve the characteristics of approximate computing in terms of power consumption, area, life expectancy and precision. This paper does not address specification and design of approximate hardware/ software/algorithms, but provides an in-depth knowledge on how the reliability and test related techniques can be efficiently used to maximize the benefits of approximate computing. . . Keywords Approximate computing Reliability Test 1 Introduction energy consumption [7]. It is then mandatory to improve the energy efficiency of such applications and also of the future In the past decades, the semiconductor industry has shown silicon architectures and devices. great improvements in terms of system energy efficiency Fortunately, applications such as RMS often feature intrin- through multi-core designs and (ultra-) low power compo- sic error-resilience [8]. For example, in video applications, nents. However, as reported in [45] the energy consumption some types of errors such as locally adaptive quantization of computer systems is still growing at an alarming rate. A can be easily tolerated, as long as the processing errors remain large number of applications, usually http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of Electronic Testing Springer Journals

Test and Reliability in Approximate Computing

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Publisher
Springer US
Copyright
Copyright © 2018 by Springer Science+Business Media, LLC, part of Springer Nature
Subject
Engineering; Circuits and Systems; Electrical Engineering; Computer-Aided Engineering (CAD, CAE) and Design
ISSN
0923-8174
eISSN
1573-0727
D.O.I.
10.1007/s10836-018-5734-9
Publisher site
See Article on Publisher Site

Abstract

This paper presents an overview of test and reliability approaches for approximate computing architectures. We focus on how specific methods for test and reliability can be used to improve the characteristics of approximate computing in terms of power consumption, area, life expectancy and precision. This paper does not address specification and design of approximate hardware/ software/algorithms, but provides an in-depth knowledge on how the reliability and test related techniques can be efficiently used to maximize the benefits of approximate computing. . . Keywords Approximate computing Reliability Test 1 Introduction energy consumption [7]. It is then mandatory to improve the energy efficiency of such applications and also of the future In the past decades, the semiconductor industry has shown silicon architectures and devices. great improvements in terms of system energy efficiency Fortunately, applications such as RMS often feature intrin- through multi-core designs and (ultra-) low power compo- sic error-resilience [8]. For example, in video applications, nents. However, as reported in [45] the energy consumption some types of errors such as locally adaptive quantization of computer systems is still growing at an alarming rate. A can be easily tolerated, as long as the processing errors remain large number of applications, usually

Journal

Journal of Electronic TestingSpringer Journals

Published: May 31, 2018

References

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