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Switchable diode effect in oxygen vacancy-modulated SrTiO3 single crystal

Switchable diode effect in oxygen vacancy-modulated SrTiO3 single crystal SrTiO3 (STO) single crystal wafer was annealed in vacuum, and co-planar metal–insulator–metal structure of Pt/Ti/STO/Ti/Pt were formed by sputtering Pt/Ti electrodes onto the surface of STO after annealing. The forming-free resistive switching behavior with self-compliance property was observed in the sample. The sample showed switchable diode effect, which is explained by a simple model that redistribution of oxygen vacancies (OVs) under the external electric field results in the formation of n–n+ junction or n+–n junction (n donated n-type semiconductor; n+ donated heavily doped n-type semiconductor). The self-compliance property is also interpreted by the formation of n–n+/n+–n junction caused by the migration of the OVs under the electric field. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Applied Physics A: Materials Science Processing Springer Journals

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References (35)

Publisher
Springer Journals
Copyright
Copyright © 2017 by Springer-Verlag GmbH Germany
Subject
Physics; Condensed Matter Physics; Optical and Electronic Materials; Nanotechnology; Characterization and Evaluation of Materials; Surfaces and Interfaces, Thin Films; Operating Procedures, Materials Treatment
ISSN
0947-8396
eISSN
1432-0630
DOI
10.1007/s00339-017-1179-8
Publisher site
See Article on Publisher Site

Abstract

SrTiO3 (STO) single crystal wafer was annealed in vacuum, and co-planar metal–insulator–metal structure of Pt/Ti/STO/Ti/Pt were formed by sputtering Pt/Ti electrodes onto the surface of STO after annealing. The forming-free resistive switching behavior with self-compliance property was observed in the sample. The sample showed switchable diode effect, which is explained by a simple model that redistribution of oxygen vacancies (OVs) under the external electric field results in the formation of n–n+ junction or n+–n junction (n donated n-type semiconductor; n+ donated heavily doped n-type semiconductor). The self-compliance property is also interpreted by the formation of n–n+/n+–n junction caused by the migration of the OVs under the electric field.

Journal

Applied Physics A: Materials Science ProcessingSpringer Journals

Published: Aug 8, 2017

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