Structure, shape, and orientation of an island adsorbed on a single-crystal surface in the case of lattice mismatch

Structure, shape, and orientation of an island adsorbed on a single-crystal surface in the case... A computer simulation is carried out to examine the structure, shape, and orientation of a monolayer adatom island as dependent on its size in the case of lattice mismatch between the island and the substrate, taking into account adatom relaxation in a constant substrate field. The island orientation with respect to the substrate lattice is shown to be influenced by the relaxation of the island structure and shape. The formation of a superstructure is revealed whose period is inversely proportional to the degree of lattice mismatch. The island is found to change its shape and orientation in the course of growth. The simulated results are compared with previous experimental findings. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Structure, shape, and orientation of an island adsorbed on a single-crystal surface in the case of lattice mismatch

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Publisher
Springer Journals
Copyright
Copyright © 2006 by Pleiades Publishing, Inc.
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1134/S1063739706050064
Publisher site
See Article on Publisher Site

Abstract

A computer simulation is carried out to examine the structure, shape, and orientation of a monolayer adatom island as dependent on its size in the case of lattice mismatch between the island and the substrate, taking into account adatom relaxation in a constant substrate field. The island orientation with respect to the substrate lattice is shown to be influenced by the relaxation of the island structure and shape. The formation of a superstructure is revealed whose period is inversely proportional to the degree of lattice mismatch. The island is found to change its shape and orientation in the course of growth. The simulated results are compared with previous experimental findings.

Journal

Russian MicroelectronicsSpringer Journals

Published: Aug 29, 2006

References

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