Structural and optical properties of SbxSe100−x (x=0, 5) thin films

Structural and optical properties of SbxSe100−x (x=0, 5) thin films We studied the structural and optical properties of SbxSe100−x (x = 0 and 5) thin films (thickness ~320 nm) deposited by thermal evaporation. The structural properties and stoichiometry of prepared samples were studied by X-ray diffraction and energy dispersive X-ray spectroscopy, respectively. With Sb addition, average coordination number increased and number of lone pair of electron, cohesive energy, fraction of floppy modes decreased. The transmission spectrum (450–2700 nm) was used to calculate the thickness, refractive index and extinction coefficient by Swanpoel’s method. Refractive index and extinction coefficient were used to obtain linear and non linear optical parameters. The refractive index, extinction coefficient, volume energy loss function, surface energy loss function, dielectric constant, dielectric loss function, optical conductivity and non-linear optical parameters increased with Sb doping to a-Se. The increase in optical parameters was due to decrease in optical band gap. The decrease in optical band gap was due to increase in density of localized states in mobility gap. The results revealed that with addition of Sb, the system becomes more stable, relaxed and rigid. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Optical and Quantum Electronics Springer Journals

Structural and optical properties of SbxSe100−x (x=0, 5) thin films

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Publisher
Springer US
Copyright
Copyright © 2017 by Springer Science+Business Media, LLC
Subject
Physics; Optics, Lasers, Photonics, Optical Devices; Electrical Engineering; Characterization and Evaluation of Materials; Computer Communication Networks
ISSN
0306-8919
eISSN
1572-817X
D.O.I.
10.1007/s11082-017-1123-3
Publisher site
See Article on Publisher Site

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