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Strain accommodation of <110>-normal direction-oriented grains in micro-shear bands of high-purity tantalum

Strain accommodation of <110>-normal direction-oriented grains in micro-shear bands of... The <110>ND<uvw>(<110>//normal direction)(<110>ND) grains in micro-shear bands in high-purity tantalum were investigated using electron backscatter diffraction and X-ray line profile analysis. The generation of the <110>ND grains and their subdivision and rotation behaviors upon the subsequent deformation were characterized by multi-scale analysis methods based on information about the slip systems, misorientation angle/axes and stored energy. The obtained results show that in the transverse plane, <110>ND grains are oriented at angles of 15°–25° to the adjacent deformed matrices in the 60% rolled specimen, and at angles of 25°–35° in the 87% rolled specimen. The <110>ND grain provided strain accommodation during the shear deformation. Moreover, the energy of the <110>ND grains in the 87% rolled specimen is approximately three times larger than that in the 60% rolled specimen, indicating that the role of strain accommodation is enhanced with the increase in the micro-shear stress concentration in a local region in tantalum. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Journal of Materials Science Springer Journals

Strain accommodation of <110>-normal direction-oriented grains in micro-shear bands of high-purity tantalum

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Publisher
Springer Journals
Copyright
Copyright © 2018 by Springer Science+Business Media, LLC, part of Springer Nature
Subject
Materials Science; Materials Science, general; Characterization and Evaluation of Materials; Polymer Sciences; Continuum Mechanics and Mechanics of Materials; Crystallography and Scattering Methods; Classical Mechanics
ISSN
0022-2461
eISSN
1573-4803
DOI
10.1007/s10853-018-2506-y
Publisher site
See Article on Publisher Site

Abstract

The <110>ND<uvw>(<110>//normal direction)(<110>ND) grains in micro-shear bands in high-purity tantalum were investigated using electron backscatter diffraction and X-ray line profile analysis. The generation of the <110>ND grains and their subdivision and rotation behaviors upon the subsequent deformation were characterized by multi-scale analysis methods based on information about the slip systems, misorientation angle/axes and stored energy. The obtained results show that in the transverse plane, <110>ND grains are oriented at angles of 15°–25° to the adjacent deformed matrices in the 60% rolled specimen, and at angles of 25°–35° in the 87% rolled specimen. The <110>ND grain provided strain accommodation during the shear deformation. Moreover, the energy of the <110>ND grains in the 87% rolled specimen is approximately three times larger than that in the 60% rolled specimen, indicating that the role of strain accommodation is enhanced with the increase in the micro-shear stress concentration in a local region in tantalum.

Journal

Journal of Materials ScienceSpringer Journals

Published: May 29, 2018

References