Stationary Intensity Profiles of Recombination Waves in Si:Zn

Stationary Intensity Profiles of Recombination Waves in Si:Zn For slow recombination waves in Si:Zn, stationary intensity profiles along the specimen are measured with an SEM operated in the voltage-contrast mode. The main findings are as follows: (i) The intensity falls from a maximum with increasing distance from the cathode, where a stationary high-field domain is located, and almost vanishes far short of the anode. (ii) The intensity grows with specimen voltage. (iii) The voltage-contrast image for the highest specimen voltage displays oscillatory potential variation over the stationary high-field domain, indicating the stratification of electric field. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Stationary Intensity Profiles of Recombination Waves in Si:Zn

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Publisher
Kluwer Academic Publishers-Plenum Publishers
Copyright
Copyright © 2004 by MAIK “Nauka/Interperiodica”
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1023/B:RUMI.0000033827.56926.fa
Publisher site
See Article on Publisher Site

Abstract

For slow recombination waves in Si:Zn, stationary intensity profiles along the specimen are measured with an SEM operated in the voltage-contrast mode. The main findings are as follows: (i) The intensity falls from a maximum with increasing distance from the cathode, where a stationary high-field domain is located, and almost vanishes far short of the anode. (ii) The intensity grows with specimen voltage. (iii) The voltage-contrast image for the highest specimen voltage displays oscillatory potential variation over the stationary high-field domain, indicating the stratification of electric field.

Journal

Russian MicroelectronicsSpringer Journals

Published: Oct 18, 2004

References

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