Atomic-force microscopy, reflectometry, and ellipsometry were applied to analysis of ultrathin films (3.3–13.6 nm) of a rigid-chain polyimide, formed on the surface of a silicon substrate by thermal imidization of Langmuir-Blodgett films of polyamido acid derived from 3,3′,4,4′-diphenyltetracarboxylic acid and ortho-tolidine.
Russian Journal of Applied Chemistry – Springer Journals
Published: Nov 24, 2005
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