Special Issue on Radiation Hardness Assurance in Microelectronics

Special Issue on Radiation Hardness Assurance in Microelectronics Russian Microelectronics, Vol. 33, No. 2, 2004, p. 63. Translated from Mikroelektronika, Vol. 33, No. 2, 2004, pp. 83–84. Original Russian Text Copyright © 2004 by the Editorial Board. Special Issue on Radiation Hardness Assurance in Microelectronics Radiation-hardened microelectronics has experi- wealth of information thus gained makes predictions enced a dramatic growth in the amount of radiation test- far more reliable. ing required. This stems from the need for the hardness At the same time, consideration should be given to assurance of all designs, the diversity of operating con- the special features of the IC under test and to its pur- ditions to be covered by tests, the need for evaluating pose. The tendency toward new designs and applica- radiation tolerance during manufacture, and heavy tions necessitates an increasingly deep understanding demands placed on the reliability of test results. of radiation-induced processes in ICs. A traditional approach to the hardness-assurance This special issue addresses the modeling and simu- testing of integrated circuits (ICs) relies on particle lation of ionizing radiation effects in ICs and their ele- accelerators and nuclear reactors. Its main disadvan- ments. Emphasis is placed on radiation-response mech- tages are the complexity, high cost, and low perfor- anisms, the equivalence of models to actual radiations, mance of test facilities. Moreover, such tests do not and practical approaches to hardening. The papers pre- allow one to predict radiation response in certain radia- sented reflect current trends in the field. tion environments and modes of operation unless spe- cial assumptions are made. Professor Tatevos Mamikonovich Agakhanyan, a The above problems have stimulated the develop- long-time editor of Mikroelektronika, was the moving ment of physical and numerical simulation in which the spirit behind this publication. It might be seen as a tes- radiation of interest is replaced with another one that is timony to his accomplishments in radiation-hardened equivalent in terms of major effects on the IC. The new electronics since the mid-1970s, when he started a spe- approach depends on the understanding of the physics cial research group at the Moscow Institute of Engi- that governs the radiation response. neering Physics (Technical University). This activity continues to yield important results and to influence Novel radiation simulators use efficient and inex- pensive tools such as x-ray, laser, fission, etc., sources. related work at other institutions. They are readily integrated with process and checkout equipment and are fully compatible with computer- controlled instrumentation of any complexity. The Editorial Board 1063-7397/04/3302-0063 © 2004 MAIK “Nauka / Interperiodica” http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Special Issue on Radiation Hardness Assurance in Microelectronics

Russian Microelectronics , Volume 33 (2) – Oct 18, 2004
Free
1 page

Loading next page...
1 Page
 
/lp/springer_journal/special-issue-on-radiation-hardness-assurance-in-microelectronics-66hXGHlgaV
Publisher
Kluwer Academic Publishers-Plenum Publishers
Copyright
Copyright © 2004 by MAIK “Nauka/Interperiodica”
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1023/B:RUMI.0000018709.75329.e3
Publisher site
See Article on Publisher Site

There are no references for this article.

You’re reading a free preview. Subscribe to read the entire article.


DeepDyve is your
personal research library

It’s your single place to instantly
discover and read the research
that matters to you.

Enjoy affordable access to
over 12 million articles from more than
10,000 peer-reviewed journals.

All for just $49/month

Explore the DeepDyve Library

Unlimited reading

Read as many articles as you need. Full articles with original layout, charts and figures. Read online, from anywhere.

Stay up to date

Keep up with your field with Personalized Recommendations and Follow Journals to get automatic updates.

Organize your research

It’s easy to organize your research with our built-in tools.

Your journals are on DeepDyve

Read from thousands of the leading scholarly journals from SpringerNature, Elsevier, Wiley-Blackwell, Oxford University Press and more.

All the latest content is available, no embargo periods.

See the journals in your area

Monthly Plan

  • Read unlimited articles
  • Personalized recommendations
  • No expiration
  • Print 20 pages per month
  • 20% off on PDF purchases
  • Organize your research
  • Get updates on your journals and topic searches

$49/month

Start Free Trial

14-day Free Trial

Best Deal — 39% off

Annual Plan

  • All the features of the Professional Plan, but for 39% off!
  • Billed annually
  • No expiration
  • For the normal price of 10 articles elsewhere, you get one full year of unlimited access to articles.

$588

$360/year

billed annually
Start Free Trial

14-day Free Trial