The influence of capacitive couplings of the buses connecting differential parts of two-phase CMOS logic elements with a 65-nm design rule on the failure sensitivity of elements due to the effect of separate nuclear particles is simulated. The sensitivity characteristics of two-phase inverters, NAND elements, trigger cells, and controlling elements of RS and D triggers is determined. The effects of the separate nuclear particle were simulated by current pulses with the rise time constant of 10 ps and fall time constants of 30 ps and 300 ps. The admissible values of capacitances of inputs of differential parts of two-phase CMOS logic elements of 0.3...0.7 fF are established depending on the element type and its logic state. The critical charges for two-phase logic elements are 32–88 fC, which is better by a factor of 10–15 than for elements with the conventional CMOS circuit technology with the same 65-nm design rule.
Russian Microelectronics – Springer Journals
Published: Jul 12, 2012
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