Simulation of the local effect of nuclear particles on 65-nm CMOS DICE memory cells

Simulation of the local effect of nuclear particles on 65-nm CMOS DICE memory cells Sensitivity characteristics of the DICE CMOS memory cells as two-phase D triggers with the 65-nm design rule. The dependences of critical values of the amplitudes of current pulses causing the failures during recording and storing the data are determined for various coupling capacitances of differential inputs of two-phase inverters in the composition of the memory cell. The following limitations for the values of these capacitances are established: 0.4–0.5 fF for memory cells based on NMOS transistors with a channel width of 400 nm and 0.2–0.3 fF for NMOS transistors with a channel width of 120 nm. Evaluations of critical integral charges that characterize the failure tolerance under the effect of separate nuclear particles give correspondingly values of 25–20 fC, which is larger by a factor of 8 compared with the 6-transistor CMOS memory cells. Russian Microelectronics Springer Journals

Simulation of the local effect of nuclear particles on 65-nm CMOS DICE memory cells

Loading next page...
SP MAIK Nauka/Interperiodica
Copyright © 2012 by Pleiades Publishing, Ltd.
Engineering; Electrical Engineering
Publisher site
See Article on Publisher Site


You’re reading a free preview. Subscribe to read the entire article.

DeepDyve is your
personal research library

It’s your single place to instantly
discover and read the research
that matters to you.

Enjoy affordable access to
over 12 million articles from more than
10,000 peer-reviewed journals.

All for just $49/month

Explore the DeepDyve Library

Unlimited reading

Read as many articles as you need. Full articles with original layout, charts and figures. Read online, from anywhere.

Stay up to date

Keep up with your field with Personalized Recommendations and Follow Journals to get automatic updates.

Organize your research

It’s easy to organize your research with our built-in tools.

Your journals are on DeepDyve

Read from thousands of the leading scholarly journals from SpringerNature, Elsevier, Wiley-Blackwell, Oxford University Press and more.

All the latest content is available, no embargo periods.

See the journals in your area

Monthly Plan

  • Read unlimited articles
  • Personalized recommendations
  • No expiration
  • Print 20 pages per month
  • 20% off on PDF purchases
  • Organize your research
  • Get updates on your journals and topic searches


Start Free Trial

14-day Free Trial

Best Deal — 39% off

Annual Plan

  • All the features of the Professional Plan, but for 39% off!
  • Billed annually
  • No expiration
  • For the normal price of 10 articles elsewhere, you get one full year of unlimited access to articles.



billed annually
Start Free Trial

14-day Free Trial