Selection of the heating method of semiconductor devices during their testing in a high-conductivity state

Selection of the heating method of semiconductor devices during their testing in a... Possible heating methods of power semiconductor devices during their testing in a high-conductivity state are discussed. It is shown that the diffusion capacitance of the p–n junction has a significant effect on measurements of device parameters. The effect of the diffusion capacitance on the results of testing of power semiconductor devices at various shapes of heating-current pulses was investigated. Conclusions on the possibility of using current pulses of various shapes for testing power semiconductor devices in the highconductivity state are drawn. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Electrical Engineering Springer Journals

Selection of the heating method of semiconductor devices during their testing in a high-conductivity state

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Publisher
Allerton Press
Copyright
Copyright © 2017 by Allerton Press, Inc.
Subject
Engineering; Manufacturing, Machines, Tools
ISSN
1068-3712
eISSN
1934-8010
D.O.I.
10.3103/S1068371217060074
Publisher site
See Article on Publisher Site

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