A major challenge regarding thin films is the characterization of their rheology and the measurement of the fluid physical parameters. For complex fluids, performing direct rheology measurements is extremely difficult considering the geometric characteristics of thin films. In this paper, we present a method for characterizing the film rheology based on measurements at regular time intervals of the film surface topography. These measures allow us, by solving an inverse problem, to validate a model of rheology for the thin fluid film and to determine the physical parameters specific to this model.
Experiments in Fluids – Springer Journals
Published: Aug 19, 2012
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