Rapid and nondestructive layer number identification of two-dimensional layered transition metal dichalcogenides

Rapid and nondestructive layer number identification of two-dimensional layered transition metal... MoS2, MoSe2 and WSe2 thin flakes were fabricated by the standard micromechanical cleavage procedures. The thickness and the optical contrast of the atomic thin dichalcogenide flakes on SiO2/Si substrates were measured by atomic force microscopy (AFM) and spectroscopic ellipsometer. A rapid and nondestructive method by using reflection spectra was proposed to identify the layer number of 2D layered transition metal dichalcogenides on SiO2 (275 nm)/Si substrates. The contrast spectra of 2D nanosheets with different layer numbers are in agreement with theoretical calculations based on Fresnel’s law, indicating that this method provides an unambiguous and nondestructive contrast spectra fingerprint for identifying single- and few-layered transition metal dichalcogenides. The results will greatly help in fundamental research and application. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Rare Metals Springer Journals

Rapid and nondestructive layer number identification of two-dimensional layered transition metal dichalcogenides

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Publisher
Nonferrous Metals Society of China
Copyright
Copyright © 2017 by The Nonferrous Metals Society of China and Springer-Verlag Berlin Heidelberg
Subject
Materials Science; Metallic Materials; Nanotechnology; Ceramics, Glass, Composites, Natural Materials; Surfaces and Interfaces, Thin Films; Inorganic Chemistry; Physical Chemistry
ISSN
1001-0521
eISSN
1867-7185
D.O.I.
10.1007/s12598-017-0927-4
Publisher site
See Article on Publisher Site

Abstract

MoS2, MoSe2 and WSe2 thin flakes were fabricated by the standard micromechanical cleavage procedures. The thickness and the optical contrast of the atomic thin dichalcogenide flakes on SiO2/Si substrates were measured by atomic force microscopy (AFM) and spectroscopic ellipsometer. A rapid and nondestructive method by using reflection spectra was proposed to identify the layer number of 2D layered transition metal dichalcogenides on SiO2 (275 nm)/Si substrates. The contrast spectra of 2D nanosheets with different layer numbers are in agreement with theoretical calculations based on Fresnel’s law, indicating that this method provides an unambiguous and nondestructive contrast spectra fingerprint for identifying single- and few-layered transition metal dichalcogenides. The results will greatly help in fundamental research and application.

Journal

Rare MetalsSpringer Journals

Published: Jun 21, 2017

References

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