Processing of Yield Map Data

Processing of Yield Map Data Yield maps reflect systematic and random sources of yield variation as well as numerous errors caused by the harvest and mapping procedures used. A general framework for processing of multi-year yield map data was developed. Steps included (1) raw data screening, (2) standardization, (3) interpolation, (4) classification of multi-year yield maps, (5) post-classification spatial filtering to create spatially contiguous yield classes, and (6) statistical evaluation of classification results. The techniques developed allow more objective mapping of yield zones, which are an important data layer in algorithms for prescribing variable rates of production inputs. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Precision Agriculture Springer Journals

Processing of Yield Map Data

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Publisher
Kluwer Academic Publishers
Copyright
Copyright © 2005 by Springer Science+Business Media, Inc.
Subject
Life Sciences; Agriculture; Soil Science & Conservation; Remote Sensing/Photogrammetry; Statistics for Engineering, Physics, Computer Science, Chemistry and Earth Sciences; Atmospheric Sciences
ISSN
1385-2256
eISSN
1573-1618
D.O.I.
10.1007/s11119-005-1035-2
Publisher site
See Article on Publisher Site

Abstract

Yield maps reflect systematic and random sources of yield variation as well as numerous errors caused by the harvest and mapping procedures used. A general framework for processing of multi-year yield map data was developed. Steps included (1) raw data screening, (2) standardization, (3) interpolation, (4) classification of multi-year yield maps, (5) post-classification spatial filtering to create spatially contiguous yield classes, and (6) statistical evaluation of classification results. The techniques developed allow more objective mapping of yield zones, which are an important data layer in algorithms for prescribing variable rates of production inputs.

Journal

Precision AgricultureSpringer Journals

Published: Jan 20, 2005

References

  • An evaluation of the response of yield monitors and combines to varying yields
    Arslan, S.; Colvin, T. S.
  • Grain yield mapping: yield sensing, yield reconstruction, and errors
    Arslan, S.; Colvin, T. S.

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