The response of IC operational amplifiers (op amps) to pulsed ionizing irradiation is studied theoretically and experimentally. The major mechanisms of the radiation response are covered. The contributions of main op-amp stages to the output-voltage response are analyzed. The ionization-induced failure of an op amp is traced to its intermediate stages. It is established that the recovery time depends on the type of compensation employed. A block-model approach is proposed as a method for the prediction of transient radiation responses. Ways to define the performance index of an op amp exposed to pulsed ionizing radiation are discussed.
Russian Microelectronics – Springer Journals
Published: Oct 13, 2004
It’s your single place to instantly
discover and read the research
that matters to you.
Enjoy affordable access to
over 18 million articles from more than
15,000 peer-reviewed journals.
All for just $49/month
Query the DeepDyve database, plus search all of PubMed and Google Scholar seamlessly
Save any article or search result from DeepDyve, PubMed, and Google Scholar... all in one place.
All the latest content is available, no embargo periods.
“Whoa! It’s like Spotify but for academic articles.”@Phil_Robichaud