Predicting the Effect of Pulsed Ionizing Radiation on Operational Amplifiers

Predicting the Effect of Pulsed Ionizing Radiation on Operational Amplifiers The response of IC operational amplifiers (op amps) to pulsed ionizing irradiation is studied theoretically and experimentally. The major mechanisms of the radiation response are covered. The contributions of main op-amp stages to the output-voltage response are analyzed. The ionization-induced failure of an op amp is traced to its intermediate stages. It is established that the recovery time depends on the type of compensation employed. A block-model approach is proposed as a method for the prediction of transient radiation responses. Ways to define the performance index of an op amp exposed to pulsed ionizing radiation are discussed. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Predicting the Effect of Pulsed Ionizing Radiation on Operational Amplifiers

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Publisher
Kluwer Academic Publishers-Plenum Publishers
Copyright
Copyright © 2002 by MAIK "Nauka/Interperiodica"
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1023/A:1020933909543
Publisher site
See Article on Publisher Site

Abstract

The response of IC operational amplifiers (op amps) to pulsed ionizing irradiation is studied theoretically and experimentally. The major mechanisms of the radiation response are covered. The contributions of main op-amp stages to the output-voltage response are analyzed. The ionization-induced failure of an op amp is traced to its intermediate stages. It is established that the recovery time depends on the type of compensation employed. A block-model approach is proposed as a method for the prediction of transient radiation responses. Ways to define the performance index of an op amp exposed to pulsed ionizing radiation are discussed.

Journal

Russian MicroelectronicsSpringer Journals

Published: Oct 13, 2004

References

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