Polymer surface deformation under semicontact-mode AFM scanning

Polymer surface deformation under semicontact-mode AFM scanning An experiment and a computer simulation are presented concerning the tip-induced deformation of polyethylene under semicontact-mode AFM scanning. The dependence is investigated of the deformation on normalized amplitude of scanning with due regard to cantilever damping. The measured and the simulated deformation curve are found to agree for sufficiently large normalized scanning amplitudes. Otherwise, the experiment and the simulation diverge. Reasons for this disagreement are suggested within the context of different physical processes influencing the deformation. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Polymer surface deformation under semicontact-mode AFM scanning

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Publisher
Springer Journals
Copyright
Copyright © 2007 by Pleiades Publishing, Ltd.
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1134/S1063739707030055
Publisher site
See Article on Publisher Site

Abstract

An experiment and a computer simulation are presented concerning the tip-induced deformation of polyethylene under semicontact-mode AFM scanning. The dependence is investigated of the deformation on normalized amplitude of scanning with due regard to cantilever damping. The measured and the simulated deformation curve are found to agree for sufficiently large normalized scanning amplitudes. Otherwise, the experiment and the simulation diverge. Reasons for this disagreement are suggested within the context of different physical processes influencing the deformation.

Journal

Russian MicroelectronicsSpringer Journals

Published: May 25, 2007

References

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