Pile-up corrections in laser-driven pulsed X-ray sources

Pile-up corrections in laser-driven pulsed X-ray sources A formalism for treating the pile-up produced in solid-state detectors by laser-driven pulsed X-ray sources has been developed. It allows the direct use of X-ray spectroscopy without artificially decreasing the number of counts in the detector, assuming the duration of a pulse is much shorter than the detector response time and the loss of counts from the energy window of the detector can be modeled or neglected. Experimental application shows that having a small amount of pile-up subsequently corrected improves the signal-to-noise ratio, which would be more beneficial than the strict single-hit condition usually imposed on this detectors. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Applied Physics B Springer Journals

Pile-up corrections in laser-driven pulsed X-ray sources

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Publisher
Springer Journals
Copyright
Copyright © 2018 by Springer-Verlag GmbH Germany, part of Springer Nature
Subject
Physics; Physics, general; Physical Chemistry; Optics, Lasers, Photonics, Optical Devices; Quantum Optics; Engineering, general
ISSN
0946-2171
eISSN
1432-0649
D.O.I.
10.1007/s00340-018-6982-1
Publisher site
See Article on Publisher Site

Abstract

A formalism for treating the pile-up produced in solid-state detectors by laser-driven pulsed X-ray sources has been developed. It allows the direct use of X-ray spectroscopy without artificially decreasing the number of counts in the detector, assuming the duration of a pulse is much shorter than the detector response time and the loss of counts from the energy window of the detector can be modeled or neglected. Experimental application shows that having a small amount of pile-up subsequently corrected improves the signal-to-noise ratio, which would be more beneficial than the strict single-hit condition usually imposed on this detectors.

Journal

Applied Physics BSpringer Journals

Published: May 29, 2018

References

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