Noncontact temperature measurement on dielectrics and semiconductors, part 2

Noncontact temperature measurement on dielectrics and semiconductors, part 2 A review is presented of noncontact temperature-measurement methods for dielectrics and semiconductors in the monocrystalline and the vitreous state, as well as in the form of porous ceramic or vacuum-deposited coating. Extensive coverage is given to the use of the spectral dependence of the linear absorption coefficient and the refractive index. Recommendations are made for selection of a spectral range of temperature measurement on the surface and a thin surface layer of different materials. Approaches are considered to determining temperature fields in the bulk of dielectrics and semiconductors. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Noncontact temperature measurement on dielectrics and semiconductors, part 2

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Publisher
Nauka/Interperiodica
Copyright
Copyright © 2005 by MAIK “Nauka/Interperiodica”
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1007/s11180-005-0001-z
Publisher site
See Article on Publisher Site

Abstract

A review is presented of noncontact temperature-measurement methods for dielectrics and semiconductors in the monocrystalline and the vitreous state, as well as in the form of porous ceramic or vacuum-deposited coating. Extensive coverage is given to the use of the spectral dependence of the linear absorption coefficient and the refractive index. Recommendations are made for selection of a spectral range of temperature measurement on the surface and a thin surface layer of different materials. Approaches are considered to determining temperature fields in the bulk of dielectrics and semiconductors.

Journal

Russian MicroelectronicsSpringer Journals

Published: Feb 19, 2005

References

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