Transient processes due to the inductive properties of interconnections are considered. The hierarchy of characteristic physical times is discussed at a qualitative level. From model solutions of the telegraph equations, a perturbation parameter is derived. It allows asymptotic representation in terms of the RLCand RCmodels of interconnections. Associated estimates for submicron technologies are given.
Russian Microelectronics – Springer Journals
Published: Oct 10, 2004
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