Methods of separation of semiconductor devices by reliability with the use of a low-frequency noise and X-ray irradiation

Methods of separation of semiconductor devices by reliability with the use of a low-frequency... Methods of the separation of semiconductor devices (SDs) by reliability with the use of parameters of low-frequency (LF) noise under the effect of X-ray irradiation are considered. Different methods of the separation of SDs by reliability depending on their constructive features are suggested. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Methods of separation of semiconductor devices by reliability with the use of a low-frequency noise and X-ray irradiation

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Publisher
SP MAIK Nauka/Interperiodica
Copyright
Copyright © 2011 by Pleiades Publishing, Ltd.
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1134/S1063739710061010
Publisher site
See Article on Publisher Site

Abstract

Methods of the separation of semiconductor devices (SDs) by reliability with the use of parameters of low-frequency (LF) noise under the effect of X-ray irradiation are considered. Different methods of the separation of SDs by reliability depending on their constructive features are suggested.

Journal

Russian MicroelectronicsSpringer Journals

Published: Jan 15, 2011

References

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