Methods of functional-logic simulation of radiation-induced failures of electronic systems based on the fuzzy state machine model

Methods of functional-logic simulation of radiation-induced failures of electronic systems based... The methods of functional-logic simulation of radiation-induced failures of electronic systems based on the Brauer fuzzy state machine model are presented. Recommendations for methods of radiationinduced failure prediction in the electronic component base are given. Theoretical and experimental results for the radiation fault tolerance of 1617 large-scale integrated circuits based on complementary metal–oxide–semiconductor structures are given as an example. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Methods of functional-logic simulation of radiation-induced failures of electronic systems based on the fuzzy state machine model

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Publisher
Pleiades Publishing
Copyright
Copyright © 2017 by Pleiades Publishing, Ltd.
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1134/S1063739717030027
Publisher site
See Article on Publisher Site

Abstract

The methods of functional-logic simulation of radiation-induced failures of electronic systems based on the Brauer fuzzy state machine model are presented. Recommendations for methods of radiationinduced failure prediction in the electronic component base are given. Theoretical and experimental results for the radiation fault tolerance of 1617 large-scale integrated circuits based on complementary metal–oxide–semiconductor structures are given as an example.

Journal

Russian MicroelectronicsSpringer Journals

Published: Jun 2, 2017

References

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