Methods of construction of the criterial membership function for the prediction of functional failures of large-scale integrated circuits under the effect of radiative and electromagnetic radiations

Methods of construction of the criterial membership function for the prediction of functional... Methods of construction of the criterial membership function (CMF) in order to provide the resistance of large-scale integrated circuits (IC) to radiative and electromagnetic radiations at the functional-logical description level are described. These functions are based on a model of the Brauer fuzzy digital automation. A principal distinction of this method from conventional ones is the possibility of the account in the explicit form of the dependence of the resistance of functional-logical models of LSICs on the effect type, operational mode, functional state, and circuit solutions. Algorithms and recommendations on the methods of prediction of radiative effects in LSICs caused by electromagnetic, steady-state, and pulsed radiations are given. http://www.deepdyve.com/assets/images/DeepDyve-Logo-lg.png Russian Microelectronics Springer Journals

Methods of construction of the criterial membership function for the prediction of functional failures of large-scale integrated circuits under the effect of radiative and electromagnetic radiations

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Publisher
Springer Journals
Copyright
Copyright © 2010 by Pleiades Publishing, Ltd.
Subject
Engineering; Electrical Engineering
ISSN
1063-7397
eISSN
1608-3415
D.O.I.
10.1134/S1063739710020058
Publisher site
See Article on Publisher Site

Abstract

Methods of construction of the criterial membership function (CMF) in order to provide the resistance of large-scale integrated circuits (IC) to radiative and electromagnetic radiations at the functional-logical description level are described. These functions are based on a model of the Brauer fuzzy digital automation. A principal distinction of this method from conventional ones is the possibility of the account in the explicit form of the dependence of the resistance of functional-logical models of LSICs on the effect type, operational mode, functional state, and circuit solutions. Algorithms and recommendations on the methods of prediction of radiative effects in LSICs caused by electromagnetic, steady-state, and pulsed radiations are given.

Journal

Russian MicroelectronicsSpringer Journals

Published: Apr 6, 2010

References

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